Microscopic structure in pressure sensitive adhesives: an ultrasmall angle X-ray study
- Author: E. Maurer, S. Loi, D. Wulff, N. Willenbacher, P. Müller-Buschbaum
- Source: Physica B, 357 144-147 (2005)
We applied ultrasmall angle X-ray scattering (USAX) in the context of pressure sensitive adhesive (PSA) debonding.
Microscopic structures, as detected by USAX, complete macroscopic structural information from standard optical
microscopy. As a model PSA, a statistical copolymer was investigated. Asymmetric USAX pattern were detected. The
data are modelled by a tilted one-dimensional grating of slits.