A Control Theory Informed Machine Learning-Based Modelling and Monitoring of Nanoparticle Generation Process

  • Autor:

    D. Cuturic, J. V. Weidemann, F. E. Kruis, S. X. Ding, M. S. Obergfell, C. Louen
  • Quelle:

    IEEE Transactions on Industrial Informatics, 2025, 1-11, doi: 10.1109/TII.2025.3576870