Institut für Mechanische Verfahrenstechnik und Mechanik

"Probing the Absolute Scattering Intensity by means of a Lab-based SAXS Camera Using an Imaging Plate Detector."

  • Autor:

    Gutsche, A., Dingenouts, N., Guo, X., Meier, M., Nirschl, H. 

  • Quelle:

    J. Appl. Crystallogr. 2015 (Accepted for publication).